Memorias de investigación
Research Project:
Variability in Nanometric technologies: Tolerance, Reliability and Benefits

Research Areas
  • Microelectronics,
  • Electronic circuits

Circuits of current nanometer technologies suffer from great variabiliy both static (process variations) and dynamic (temperature, voltage and aging). Designers can increase reliability of these circutis by implementing specific mechanisms to deal with this variability. In this project we first propose to design and implement robust sensors to be part of variability monitoring networks. A key goal of this project is that the sensors must be aging and radiation tolerant, because both variables significantly affect the performance of nanometric circuits, even at ground level. As pre-fabrication validation support we will develop a complex simulation framework that can systematically and efficiently deal with the three views faced in the project: variability, aging and radiation. There can be also seen a positive side of variability. There are systems that require certain randomness which can be found in the variability suffered by the circuit. This usually happens in authentication or security systems. Another goal of this project is to design two basic primitives in security systems: PUF (Physiscally Unclonable Functions) and RNGs (Random Number Generators) based on variability sensors. Finally, we will explore the potential use of emerging devices taking advantage of the expertise of the research group on modeling and simulation of memristors. We make a step forward and we propose the use of this kind of emerging devices to implement a variability sensor.
Project type
Proyectos y convenios en convocatorias públicas competitivas
Ministerio de Economía y Competitividad
Entity Nationality
Entity size
Granting date

Research Group, Departaments and Institutes related
  • Creador: Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
  • Departamento: Ingeniería Electrónica