Memorias de investigación
Research Publications in journals:
III-Nitride-based junction devices round contacts: effect of semiconductor film geometry and characteristics on the capacitance and conductance measurements
Year:2019

Research Areas

Information
Abstract
0
International
Si
JCR
Si
Title
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISBN
0957-4522
Impact factor JCR
2,324
Impact info
Volume
30
10.1007/s10854-019-01459-x
Journal number
12
From page
11164
To page
11170
Month
Ranking
0
Participants

Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Centro o Instituto I+D+i: Centro de Materiales y Dispositivos Avanzados para Tecnologías de Información y Comunicaciones
  • Departamento: Sistemas Aeroespaciales, Transporte Aéreo y Aeropuertos