Abstract



Contrarily to current theories based on hypothetical traps where charge carriers can translocate to, this paper gives an explanation for 1/f electrical noise in solidstate devices based on well known electrical effects taking place in these devices. A parasitic capacitor and the backgating effect of its thermal noise, both overlooked in the course of the years, are the basis of the above explanation. The above effect produces a resistance noise with a Lorentzian spectrum in any unbiased resistor. As soon as the resistor is biased, this spectrum is scattered into a continuous set of Lorentzian noise terms that synthesize 1/f noise over a frequency band that is an exponential function of the bias voltage VDS expressed in thermal units VT. This is due to the exponential dependence of the dynamical resistance in most semiconductor junctions. A VDS= 180MV is thus enough to give 1/f noise over three decades at room temperature. This unexpected and nonlinear feature, where the spectrum of this noise results from the own bias used to measure it, has kept IN noise as a puzzling and enigmatic noise for more than eighty years. The above theory, born in the solidstate field, can also be generalized to other devices where two orthogonal forces or energy gradients appear while electrical noise is being measured.  
International

Si 
Congress

Conference on VLSI Circuits and Systems III 

960 
Place

Maspalomas. ESPAÑA 
Reviewers

Si 
ISBN/ISSN




Start Date

02/05/2007 
End Date

04/05/2007 
From page


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