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Abstract
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| Present vacuum microelectronics technology (VMET) is a field that has gained a great and sustained impulse during the last few decades. Electrons emitted from very sharp tips, as a result of an externally applied electric field, which is a consequence of a potential bias, tunnel through a potential energy barrier, resulting in an electric current. | |
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International
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Si |
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Congress
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New Frontiers of Atom Probe Applications |
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960 |
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Place
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Oxford, United Kingdom |
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Reviewers
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Si |
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ISBN/ISSN
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00-0000-000-0 |
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Start Date
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13/09/2009 |
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End Date
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16/09/2009 |
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From page
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0 |
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To page
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0 |
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New Frontiers of Atom Probe Applications. Abstract Book |