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Descripción
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| Present vacuum microelectronics technology (VMET) is a field that has gained a great and sustained impulse during the last few decades. Electrons emitted from very sharp tips, as a result of an externally applied electric field, which is a consequence of a potential bias, tunnel through a potential energy barrier, resulting in an electric current. | |
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Internacional
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Si |
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Nombre congreso
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New Frontiers of Atom Probe Applications |
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Tipo de participación
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960 |
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Lugar del congreso
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Oxford, United Kingdom |
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Revisores
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Si |
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ISBN o ISSN
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00-0000-000-0 |
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DOI
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Fecha inicio congreso
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13/09/2009 |
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Fecha fin congreso
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16/09/2009 |
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Desde la página
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0 |
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Hasta la página
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0 |
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Título de las actas
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New Frontiers of Atom Probe Applications. Abstract Book |