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Abstract
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| The reliability of CPV systems is a hot question considering that they must compete with silicon flat modules, which in turn have been demonstrated to be capable of withstand 25 years in field operation. In this paper, a summary of the IES-UPM achievements in this field is presented. A new method for assessing the reliability of CPV systems in real operation is needed and a first approach is presented. INTA-SPASOLAB is also getting involved in this subject and a new testing field has been installed. | |
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International
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Si |
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Congress
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34th IEEE Photovoltaic Specialists Conference |
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960 |
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Place
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Philadelphia, USA |
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Reviewers
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Si |
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ISBN/ISSN
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978-1-4244-2950-9 |
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Start Date
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07/06/2009 |
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End Date
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12/06/2009 |
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From page
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786 |
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To page
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790 |
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Proceedings Conference |