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Memorias de investigación
Artículos en revistas:
Continuous Plasma Density Measurement in TJ-II Infrared Interferometer - Advanced Signal Processing based on FPGAs
Año:2010
Áreas de investigación
  • Microelectrónica
Datos
Descripción
This work presents the behavioral simulation in an FPGA of a novel processing system for measuring line average electronic density in the TJ-II stellarator diagnostic, Infra-Red Two-Color Interferometer. Line average electronic density is proportional to phase difference between probing and reference signals of the interferometer, as the Appleton¿Hartree cold plasma model states. The novelty of the approach is the development of a real time measuring system where research work has been carried out in two ways: a new interpolation algorithm and the implementation of a new specific processor on an FPGA. The main goal of this new system is to measure line plasma electronic density for several channels in real time, also it will be useful to eliminate intermediate mixing frequency stages (the output signals coming from the interferometer are going to be directly sampled) and finally to generate real time density signals for control purposes in TJ-II and in other diagnostics. This device is intended to be the new data acquisition-processing system for the future six channel infrared interferometer that requires at least 14 input signals. The knowledge acquired could be useful in the design of W7-X and ITER IR-interferometer data acquisition and processing systems.
Internacional
Si
JCR del ISI
Si
Título de la revista
FUSION ENGINEERING AND DESIGN
ISSN
0920-3796
Factor de impacto JCR
1,122
Información de impacto
Volumen
DOI
Número de revista
Desde la página
328
Hasta la página
331
Mes
ENERO
Ranking
Esta actividad pertenece a memorias de investigación
Participantes
  • Autor: Juan Antonio Lopez Martin (UPM)
  • Autor: Octavio Nieto-Taladriz Garcia (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
  • Departamento: Ingeniería Electrónica
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