Abstract
|
|
---|---|
Adaptive Artificial Ant Colonies for Edge Detection in Digital Images | |
International
|
Si |
Congress
|
Proc. of the 36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 |
|
960 |
Place
|
Glendale, AZ, USA |
Reviewers
|
Si |
ISBN/ISSN
|
1553-572X |
|
DOI. 10.1109/IECON.2010.5675096 |
Start Date
|
07/11/2010 |
End Date
|
10/11/2010 |
From page
|
2813 |
To page
|
2816 |
|
Proc. of the 36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 |