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Abstract
|
|
|---|---|
| Feature Selection Using Sequential Forward Selection and classification applying Artificial Metaplasticity Neural Network | |
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International
|
Si |
|
Congress
|
36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 |
|
|
960 |
|
Place
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Glendale, AZ, USA |
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Reviewers
|
Si |
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ISBN/ISSN
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1553-572X |
|
|
10.1109/IECON.2010.5675075 |
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Start Date
|
07/11/2010 |
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End Date
|
10/11/2010 |
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From page
|
2845 |
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To page
|
2850 |
|
|
Proc. of the 36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 |