Site card
Hitachi S-3000 N SEM
Where:
Laser Centre
Ubicación:
90A.00.094.1
Typology:
Equipamiento científico-Tecnológico
Manager: David Muñoz
Email:
Field-emission scanning electron microscopy (FE-SEM).
Characterisation
It provides microstructural information, as well as information relating to morphology and chemical composition at a microscopic scale. It has an energy-dispersive X-ray spectrometry (EDS) module; a secondary electron module; and an X-ray dispersion spectroscopy module.
Surface characterisation
