Electron microscopy service
Description of the services offered
Analysis of micrometric and nanometric structures in samples of various sizes. Conductive and insulating samples can be analysed. Metal coating can also be requested for insulating samples. The service may be used individually after training with the equipment.
Needs requested and applications
Analysis of conductive and insulating nano and micrometric structures.
Sector or area of application
CEMDATIC, HTSE for Telecommunications
A Zeiss EVO scanning electron microscope is used to give this service, which enables
detection of backscattered and secondary electrons; variable continuous acceleration voltage between 0.02 kV and 30 kV in 10V steps; 8.5 mm analytical working distance; currents from 0.5 pA up to 5 uA; 5 axis motorised base: X, Y, Z, tilt up to 90° and 360° rotation; 310 mm internal diameter and 220 mm high sample chamber; image scanner up to 32k x 24k pixels.